Electromigration is the transport of material caused by an uneven distribution of current, causing atoms to accumulate at the anode and separate from the cathode of an electronic circuit. Materials that experience electromigration undergo a complex 3D evolution, which often results in short and open circuit failures at soldering joints. Electromigration’s...

High resolution x-ray tomography (XCT) provides a nondestructive approach to 3D imaging suitable for examining material microstructures. Current options for x-ray micro-tomography (µXCT) are limited to select research facilities that employ synchrotron light sources in XCT experiments, and overpriced lab-scale µXCT systems of insufficient...