­Background The increasing use of digital systems in everyday life has made reliability a key factor in the design of modern microprocessors. Soft errors are caused by high-energy particles, power supply noises, transistor variability, and can modify the logic value stored in microprocessor memory elements, which can cause a timing or functional...

Background Soft errors or transient faults—caused by high-energy particles that lead to an unexpected change in the transistor logic—have long been considered the main reliability challenge for many mission-critical applications. Conventionally, hardware-level soft-error resilience techniques have been employed in mission- and safety-critical...